Increasing complexity of semiconductor devices necessitates a fundamental rethinking of defect detection methodologies.

Controlling thin films to precise specifications is essential for ensuring high yield in high-performance devices.

Xtreme Pooling allows any test processor on a Pin Scale 5000 card to store vector data in other test processors’ ...

A novel universal deep learning model for segmentation of automated optical inspection images for both PCBA and semiconductor ...

A short description of process control is an accurate one—It’s a means of controlling manufacturing equipment and reducing ...

A new technical paper titled “A progressive wafer scale approach for Sub-10 nm nanogap structures” was published by ...

Detecting macro-defects on wafers and tracing them to their root cause is getting easier due to tool improvements and traceability advancements.

Incorporate testability-related structures such as core wrapper cells, x-bounding logic, and test points directly into the RTL.

At GTC 2025, Nvidia CEO Jensen Huang projected $1 trillion in global data center CapEx by 2028. At this pace, data center ...

Researchers from Ulsan National Institute of Science and Technology (UNIST) and Pohang University of Science and Technology ...

A new technical paper titled “Benchmarking Ultra-Low-Power μNPUs” was published by researchers at Imperial College London and ...

A new technical paper titled “PPAC Driven Multi-die and Multi-technology Floorplanning” was published by Texas A&M University ...